PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients

The bulk built-in current sensor (BBICS) is a cost-effective solution for detection of energetic particle strikes in integrated circuits. With an appropriate number BBICSs distributed across the chip, soft error locations can be identified, and dynamic fault-tolerant mechanisms activated locally to correct errors affected logic. In this work, we introduce pulse stretching BBICS (PS-BBICS) constructed by connecting standard custom-designed cell. aim PS-BBICS enable on-chip measurement single event transient (SET) width, allowing detect linear energy transfer (LET) incident particles, thus assess more accurately radiation conditions. Based on Spectre simulations, have shown that LET from 1 100 MeV cm 2 mg −1 , SET width detected varies 620–800 ps. threshold increases linearly with monitored inverters, it around 1.7 ten inverters. On other hand, independent inverters > 4 . It was supply voltage, temperature process variations strong impact response PS-BBICS. • A proposed. extends three-transistor adding stretcher composed two custom-sized Simulations For up 10 almost corners.